Selected Press Releases
Selected Media Coverage on Stone Pillar
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December 2007 article describes partnership with Stratosphere Solutions
to drive improved parametric yeld
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January 2006 article in Chip Design Magazine details the benefits of data integration from test chip development
through production for DFM applications
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June 24, 2005 article in EE Times features latest capabilities of Stone Pillar Suite and DFM applications
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May 24, 2005 article in Electronics Talk: "Test Software gains National Importance" features Stone Pillar TestPlanManager
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May 23, 2005 article on EDA Cafe: National Semiconductor reduces Engineering effort for test flow creation
by 90% with Stone Pillar TestPlanManager
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April 4, 2005 article in SOC Central features Stone Pillar Technologies test chip automation solutions
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March 18, 2005 issue of SOC Central features article on test chip automation by Stone Pillar founder, Anthony Clark
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February 1, 2005 issue of EDA Alert features article by Stone Pillar President, Tim Crandle, on improving DFM through intelligent use of experimental data
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December 2004: EDA Nation article on Stone Pillar Technologies and Micrel adoption of DesignRuleBuilder tool
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November 25, 2004: EDN Magazine and online features Stone Pillar Technologies in article entitled: "Watch your step: IC technology and tools face economic hurdles"
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