Stone Pillar SuiteTM – Layout Viewer
Integrated Device Layout Viewing Tool --
Stone Pillar Suite – Layout Viewer
offers an integrated visual test structure reference capability, linked to
experimental or other data. This tool can be invoked to easily confirm the
structure used to perform an electrical test.
GDS2 test chips are read into the common database model so that individual test
structure layouts can be visualized during the course of data interrogation.
Features & Benefits
- Cross-reference test structure visualization from measured data
- Rapidly clarify device specific layout design rules during data analysis
- Rapidly access a test chip's contents
- Indicate test structures of interest directly to test engineering
- Refer to specific test structure layouts in real time during engineering discussions
- Avoid mistakes derived from errors in test structure documentation
- Direct correlation from test result to test structure visualization
- Direct GDS2 test chip loading
- Manage test programs in conjunction with test chips
- Test chip, test coverage analysis
- Find test structures via quad or structure name
- List and visualize tested structures by lot or wafer
- Find and visualize test structures by device type
|
| 
